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Spain

Location
Easo 10
20006
Donostia-San Sebastian
Spain
IP rights covered
Designs
Patents
Trademarks
Services covered
Helpdesk services
Provision of intellectual property documentation
Public reading room

Location
Economic Development Agency for Asturias - IDEPA

Parque Tecnológico de Asturias, s/n
33428
Llanera
Spain
IP rights covered
Copyright
Designs
Patents
Trademarks
Utility models
Services covered
Helpdesk services
IP monitoring services
IP strategy development
Lecturer services
Provision of intellectual property documentation
Public reading room
Search services
User training

Location
Agencia de Desarrollo Económico de La Rioja (ADER)

Muro de la Mata, 13-14
26001
Logroño
Spain
IP rights covered
Designs
Patents
Trademarks
Utility models
Services covered
Helpdesk services
Provision of intellectual property documentation
Search services
User training

Location
Paseo Castellana 75
28071
Madrid
Spain
IP rights covered
Designs
Patents
Semiconductors
Supplementary protection certificate (SPC)
Trademarks
Utility models
Services covered
Helpdesk services
IP monitoring services
IP strategy development
Lecturer services
Provision of intellectual property documentation
Search services
Statistical analysis of patent data
User training

Location
Carlos III University

Avda. de la Universidad 30
E28911
Madrid
Spain
IP rights covered
Copyright
Patents
Services covered
Helpdesk services
Provision of intellectual property documentation
Public reading room
User training

Location
Regional Development Agency of Murcia

Av. de la Fama, 3
30003
Murcia
Spain
IP rights covered
Designs
Patents
Trademarks
Utility models
Services covered
Helpdesk services
IP strategy development
Lecturer services
Provision of intellectual property documentation
Public reading room
Search services
User training

Location
Departamento de Desarrollo Económico - Gobierno de Navarra

Parque Tomás Caballero 1, Edificio "Fuerte del Príncipe II", 4ª planta
31006
Pamplona
Spain
IP rights covered
Designs
Patents
Services covered
Search services
Statistical analysis of patent data